Bit error rate characterization of LoRa chirp spread spectrum modulation across spreading factors: a Simulink-based analysis
DOI: https://doi.org/10.3846/ntcs.2025.25705Abstract
Low-Power Wide-Area Networks (LPWANs) based on LoRa technology have gained prominence in Internet of Things (IoT) deployments due to their long-range communication capabilities and low power consumption. The physical layer performance of LoRa’s Chirp Spread Spectrum (CSS) modulation under varying signal-to-noise ratio (SNR) conditions is critical for network planning and optimization. This study presents a comprehensive bit error rate (BER) characterization of LoRa CSS modulation across spreading factors SF7 through SF12 using Simulink-based Monte Carlo simulations across multiple channel conditions. The simulation framework implements a LoRa-compatible CSS physical layer model, capturing the essential spreading factor and processing gain characteristics without emulating proprietary chipset-specific implementations. Results demonstrate progressive BER improvement with increasing spreading factors under AWGN, Rayleigh fading, and Rician fading channel conditions, achieving error-free transmission at SNR values ranging from –6 dB (SF7 in AWGN) to –18 dB (SF12 in AWGN). The measured SNR sensitivity gain of approximately 2–4 dB per spreading factor increment confirms theoretical predictions and validates the simulation methodology. Higher spreading factors demonstrate superior resilience under fading conditions, with SF12 maintaining near-zero BER under Rayleigh fading at accessible SNR levels while SF7 does not. These findings provide baseline performance metrics essential for LoRaWAN network deployment planning, link budget calculations, and spreading factor selection in real-world IoT applications with diverse propagation environments.
First published online 3 June 2026
Keywords:
LoRa, chirp spread spectrum, bit error rate, spreading factor, fading channels, LPWAN, IoT, Simulink, physical layerHow to Cite
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Copyright (c) 2025 The Author(s). Published by Vilnius Gediminas Technical University.

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Copyright (c) 2025 The Author(s). Published by Vilnius Gediminas Technical University.
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